Program Overview

Modern Methods in Electron Microscopy

Course Description

The course aims to provide students with a comprehensive understanding of the physical laws and principles of experimental techniques in electron microscopy. By the end of the course, students should be able to demonstrate knowledge and understanding of these principles and implement them in their future experimental work.

Learning Outcomes

• Demonstrate a thorough knowledge of the most important physics theories, including their logical and mathematical structure, experimental support, and described physical phenomena.
• Perform experiments independently using standard techniques and describe, analyze, and critically evaluate experimental data.
• Comprehend the ethical characteristics of research and professional activity in physics.
• Work in an interdisciplinary team.
• Present research or literature search results to professional and lay audiences.
• Develop written and oral English language communication skills essential for a career in physics.
• Search for and use physical and other technical literature, as well as other sources of information relevant to research work and technical project development.
• Remain informed of new developments and methods and provide professional advice on their possible range and applications.
• Participate in projects requiring advanced skills in modeling, analysis, numerical calculations, and use of technologies.

Course Specific Learning Outcomes

• Qualitatively understand and describe interactions of electrons with matter.
• Qualitatively and quantitatively describe different types of microscopes.
• Qualitatively describe principles of image formation in electron microscopes.
• Qualitatively describe the physical background of material characterization with electron microscopy.
• Quantitatively interpret experimental features on electron microscopy images.

Course Topics

1. Basics of electron microscopy and its applications in physics of materials, chemistry, and geology.
2. Modern methods of materials characterization with analytical electron microscopes, including scanning electron microscopy (SEM) and environmental scanning electron microscopy (ESEM).
3. Quantitative and qualitative phase analysis with X-ray scattering in analytical electron microscopes.
4. Transmission electron microscopy with diffraction, high-resolution electron microscopy (HREM), and high-resolution scanning electron microscopy (HRSEM).
5. Interpretation of transmission electron micrographs and diffraction in polycrystalline, single crystal, and amorphous samples.
6. Diffraction contrast and characterization of defects in materials.
7. Characterization of defects from dark and bright field images.
8. Phase contrast, high-resolution imaging, and defect determination.
9. Image processing for analysis of defects in crystals.
10. Convergent beam electron diffraction method for determining space groups, unit cell parameters, and sample thickness.
11. Latest developments in electron microscopy, including determination of oxygen atomic sites and bonds in cuprates and crystal structure determination from electron microscope images.
12. Atomic scale imaging of individual atoms doped in silicon and investigation of nanocrystalline materials.
13. Application of the Rietveld method on electron diffraction images of nanocrystalline materials.
14. Visit to the Laboratory for microstructural characterization and presentation of the basis of operating high-resolution electron microscopes.
15. Revision and systematization.

Requirements for Students

• Attend at least 80% of lectures.
• Pass two colloquiums (with the possibility of retaking if failed).
• Write a seminar from the field of electron microscopy.
• Solve one practical example.

Grading and Assessing Student Work

The final grade is determined based on active participation in discussions during lectures and the average value of grades obtained in colloquiums, seminars, and practical examples.

Literature

1. M. Ruhle and M. Wilkens, Electron Microscopy, in R.W. Cahn and P. Haasen, eds. Physical Metallurgy; fourth, revised edition, Elsevier Science BV, 1996.
2. D.B. Williams and C.B. Carter, Transmission Electron Microscopy, A Textbook for Materials Science, Plenum Press, New York 1996.
3. J.J. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, C. Fiori, E. Lihshin, Electron Microscopy and X-ray Microanalysis, Plenum Press, New York/London, 1984.
4. ELECTRON CRYSTALLOGRAPHY, Novel Approaches for Structure Determination of Nanosized Materials, the 36th international crystallographic course, Erice-Sicily, 9 to 20 June 2004.
5. J. C. H. Spence: High-Resolution Electron Microscopy, third edition, Oxford University Press, 2003.

Prerequisites for Enrollment

• Passed: Advanced Physics Lab 2
• Passed: Experimental Techniques in Physics
• Passed: Solid State Physics 1

Semester and Study Program

• 9th semester
• Regular study - Physics