Design for Testability and for Built-In Self Test Course
Program Overview
This program provides a comprehensive overview of testability for electronics, covering both theoretical concepts and practical applications. Through lectures, hands-on exercises, and case studies, participants will gain expertise in testability techniques, including built-in self-test (BIST) capabilities, and their economic value. The program emphasizes the importance of parallel development of designs and tests, and explores innovative approaches to improve circuit observability and controllability.
Program Outline
Outline:
Course Content:
- Testability for electronics
- Built-in self-test (BIST) capabilities at IC, board, and system levels
Course Structure:
- Lectures
- Hands-on exercises
- Case studies
Course Schedule:
- Not provided in the context
Individual Modules:
- Module 1: Introduction to Testability
- Cost/benefit analysis of tests
- Overcoming difficulties through easier to test designs
- Module 2: Ad Hoc and Structured DFT
- Ad hoc DFT for ICs, boards, and systems
- Structured scan techniques standardized by IEEE-1149.1 (JTAG) and other IEEE standards
- Module 3: BIST Techniques and Architectures
- Memory BIST (MBIST)
- Logic BIST (LBIST)
- Analog BIST
- Module 4: Built-In Test (BIT) Software
- Goal of BIT software to provide diagnostic information
- Module 5: System-Level Testability
- Need for repair instructions through module replacement
- Diagnostic assessment and modeling techniques
- Module 6: Economic Value of DFT and BIST
Teaching:
Teaching Methods:
- Lectures
- Hands-on exercises
- Case studies
Faculty:
- Not provided in the context
Unique Approaches:
- Focus on the need for a new paradigm where designs and tests are developed in parallel
- Simple techniques to improve observability and controllability of circuits
- Coverage of IEEE and military standards in DFT
Careers:
Potential Career Paths:
- Designers
- Test engineers
- Reliability engineers
- Logistics engineers
- Quality engineers
- Manufacturing engineers
Opportunities and Outcomes:
- Earlier time to market
- Higher failure detection
- Lower test costs
- Improved quality of units under test (UUTs)
UCLA Extension
Overview:
UCLA Extension is a renowned continuing education institution affiliated with the University of California, Los Angeles (UCLA). It offers a wide range of courses, certificates, and specializations designed for professional development, career advancement, and personal enrichment.
Services Offered:
UCLA Extension provides a comprehensive suite of services for its students, including:
Courses:
Hundreds of open-enrollment courses are available in various fields of study, delivered online, in-person, or in a hybrid format.Certificates:
Students can earn certificates in specialized areas, demonstrating their expertise and enhancing their career prospects.Specializations:
Short series of courses designed to quickly equip students with in-demand skills and knowledge in focused areas.Student Services:
UCLA Extension offers comprehensive support services, including enrollment assistance, financial aid, scholarships, transcripts, career services, and international student support.Corporate Education:
Custom programs and corporate training solutions are available to meet the professional development needs of organizations.Student Life and Campus Experience:
Key Reasons to Study There:
UCLA Affiliation:
Students benefit from the prestige and reputation of UCLA, a world-class research university.Industry Experts:
Courses are taught by experienced professionals and industry leaders, providing practical and relevant knowledge.Flexible Learning:
UCLA Extension offers a variety of learning formats, including online, in-person, and hybrid options, catering to diverse schedules and preferences.Career Advancement:
Certificates and specializations can enhance career prospects and open doors to new opportunities.Personal Enrichment:
Courses and programs cater to personal interests and provide opportunities for lifelong learning.Academic Programs:
UCLA Extension offers a wide range of academic programs across various fields, including:
Accounting & Finance
Architecture & Interior Design
Business & Management
Communications
Design & Arts
Digital Technology
Education
Engineering
Entertainment
Environmental Studies & Public Policy
Health Care & Counseling
Humanities & Social Sciences
Landscape Architecture & Horticulture
Legal Programs
Real Estate
Sciences & Math
Writing
Other:
UCLA Extension is accredited by the Western Association of Schools and Colleges (WASC), ensuring the quality and rigor of its programs.
Outline:
Course Content:
- Testability for electronics
- Built-in self-test (BIST) capabilities at IC, board, and system levels
Course Structure:
- Lectures
- Hands-on exercises
- Case studies
Course Schedule:
- Not provided in the context
Individual Modules:
- Module 1: Introduction to Testability
- Cost/benefit analysis of tests
- Overcoming difficulties through easier to test designs
- Module 2: Ad Hoc and Structured DFT
- Ad hoc DFT for ICs, boards, and systems
- Structured scan techniques standardized by IEEE-1149.1 (JTAG) and other IEEE standards
- Module 3: BIST Techniques and Architectures
- Memory BIST (MBIST)
- Logic BIST (LBIST)
- Analog BIST
- Module 4: Built-In Test (BIT) Software
- Goal of BIT software to provide diagnostic information
- Module 5: System-Level Testability
- Need for repair instructions through module replacement
- Diagnostic assessment and modeling techniques
- Module 6: Economic Value of DFT and BIST
Teaching:
Teaching Methods:
- Lectures
- Hands-on exercises
- Case studies
Faculty:
- Not provided in the context
Unique Approaches:
- Focus on the need for a new paradigm where designs and tests are developed in parallel
- Simple techniques to improve observability and controllability of circuits
- Coverage of IEEE and military standards in DFT
Careers:
Potential Career Paths:
- Designers
- Test engineers
- Reliability engineers
- Logistics engineers
- Quality engineers
- Manufacturing engineers
Opportunities and Outcomes:
- Earlier time to market
- Higher failure detection
- Lower test costs
- Improved quality of units under test (UUTs)